DocumentCode
2060007
Title
Report on a pilot project successfully implementing a design-to-test methodology
Author
Bullock, Scot
Author_Institution
Teradyne Inc., Boston, MA, USA
fYear
1995
fDate
21-25 Oct 1995
Firstpage
771
Lastpage
780
Abstract
Concurrent development of new device designs and test packages is recognized as essential to bringing new products to market faster This paper describes a series of software tools which, when used in concert, make implementation of this methodology feasible. The paper also reports on a pilot project that successfully used this implementation on a new device design and test package. An analysis of the results and lessons learned follows
Keywords
design for testability; integrated circuit design; integrated circuit testing; product development; software packages; concurrent development; design-to-test methodology; device test; new products; pilot project; software tools; test packages; Debugging; Design engineering; Design methodology; Discrete event simulation; Instruments; Integrated circuit testing; Packaging; Performance evaluation; Software testing; Software tools;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1995. Proceedings., International
Conference_Location
Washington, DC
ISSN
1089-3539
Print_ISBN
0-7803-2992-9
Type
conf
DOI
10.1109/TEST.1995.529908
Filename
529908
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