Title :
An open system to interface IEEE-488 measurement devices designed in a microelectronics environment
Author :
Perelló, C. ; Poch, N. ; Schroeter, C. ; Millán, J.
Author_Institution :
Centro Nacional de Microelectron., Univ. Autonoma de Barcelona, Spain
Abstract :
The high production level in microelectronics, leads to the need of using automated data acquisition and data analysis methods. Since often highly specialized measurement devices are used, a method is presented in this report, to build a high-level interface between the user and the measurement devices. This report proposes to use the capabilities of modern computer systems to enable parallel and remote access to measuring devices via a networked host without having to use a dedicated unit to perform this task. An approach is described on the basis of typical PC-compatible computer running the Linux OS and “Open Implementation” software
Keywords :
application program interfaces; automatic test equipment; automatic test software; computer interfaces; data acquisition; device drivers; open systems; peripheral interfaces; production testing; GPIB; IEEE-488 measurement devices; Linux OS; PC-compatible computer; application interface; application program; automated data acquisition; automated microelectronics characterisation; device driver interface; high-level interface; open implementation software; open system; parallel access; remote access; virtual instrument; Computer networks; Concurrent computing; Data acquisition; Data analysis; Linux; Microelectronics; Open systems; Operating systems; Performance evaluation; Production;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1996. IMTC-96. Conference Proceedings. Quality Measurements: The Indispensable Bridge between Theory and Reality., IEEE
Conference_Location :
Brussels
Print_ISBN :
0-7803-3312-8
DOI :
10.1109/IMTC.1996.507373
