Title :
Implementing 1149.1 in the PowerPC RISC microprocessor family
Author :
Pyron, Carol ; Bruce, W.C.
Author_Institution :
Somerset Design Centre, Motorola Inc., Austin, TX, USA
Abstract :
Selected IEEE Standard 1149.1 implementation issues are described for four PowerPC family devices. Boundary scan problems and solutions that arose during implementation of Standard features and additional private instructions are discussed
Keywords :
IEEE standards; automatic testing; boundary scan testing; computer testing; instruction sets; integrated circuit testing; reduced instruction set computing; IEEE Standard 1149.1; PowerPC family devices; RISC microprocessor family; Standard features; board-level test strategy; boundary scan problems; private instructions; Bridges; CMOS technology; Chip scale packaging; Consumer electronics; Electronics packaging; Logic devices; Microprocessors; Pins; Reduced instruction set computing; Testing;
Conference_Titel :
Test Conference, 1995. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-2992-9
DOI :
10.1109/TEST.1995.529916
