Intel386 EX embedded processor IDDQ testing

I_DDQ testing, along with stuck-at fault, AC timing, and DC testing is increasingly considered a necessity for good product quality. This paper presents an I_DDQ vector selection methodology, along with vector implementation in the production test program. I_DDQ fault seeding results show that by stuck-at fault modeling, we can detect single stuck-at nodes that were not detected before. A comparative evaluation of conventional testing methods and I_DDQ testing is presented. Experimental test results are presented that ascertain the effectiveness of I_DDQ particularly how it overlaps with stuck-at fault coverage. A practical method that estimates the test coverage overlap is applied to reduce the stuck-at improvement effort and obtain “credit” towards the Intel386 EX processor quality requirements for production. A follow-on experiment for obtaining more data is proposed and data are being collected