Optical properties of phase change materials for optical recording

Author

Bruneau, J.M. ; Bechevet, B. ; Valon, B. ; Butaud, E.

Author_Institution

MPO Disques, Averton, France

fYear

1997

fDate

7-9 April 1997

Firstpage

104

Lastpage

105

Abstract

In this paper we have studied and compared the optical intrinsic properties (refractive index, amplitude of the optical transition) of three different phase change optical recording materials, using diverse characterisation techniques such as spectrophotometric ellipsometry. From this result, we have simulated the performances of ternary semiconductor alloys in a classical case of multilayer stack and reported optical properties of those systems.

Keywords

ellipsometry; optical disc storage; optical films; optical materials; optical testing; reflectivity; solid-state phase transformations; spectrophotometry; diverse characterisation; multilayer stack; optical intrinsic properties; optical properties; optical recording; optical transition; phase change materials; phase change optical recording materials; refractive index measurement; spectrophotometric ellipsometry; ternary semiconductor alloys; Crystalline materials; Crystallization; Optical interferometry; Optical materials; Optical recording; Optical refraction; Optical variables control; Phase change materials; Reflectivity; Temperature;

fLanguage

English

Publisher

ieee

Conference_Titel

Optical Data Storage Topical Meeting, 1997. ODS. Conference Digest

Conference_Location

Tucson, AZ, USA

Print_ISBN

0-7803-3885-5

Type

conf

DOI

10.1109/ODS.1997.606144

Filename

606144