Title :
Optical properties of phase change materials for optical recording
Author :
Bruneau, J.M. ; Bechevet, B. ; Valon, B. ; Butaud, E.
Author_Institution :
MPO Disques, Averton, France
Abstract :
In this paper we have studied and compared the optical intrinsic properties (refractive index, amplitude of the optical transition) of three different phase change optical recording materials, using diverse characterisation techniques such as spectrophotometric ellipsometry. From this result, we have simulated the performances of ternary semiconductor alloys in a classical case of multilayer stack and reported optical properties of those systems.
Keywords :
ellipsometry; optical disc storage; optical films; optical materials; optical testing; reflectivity; solid-state phase transformations; spectrophotometry; diverse characterisation; multilayer stack; optical intrinsic properties; optical properties; optical recording; optical transition; phase change materials; phase change optical recording materials; refractive index measurement; spectrophotometric ellipsometry; ternary semiconductor alloys; Crystalline materials; Crystallization; Optical interferometry; Optical materials; Optical recording; Optical refraction; Optical variables control; Phase change materials; Reflectivity; Temperature;
Conference_Titel :
Optical Data Storage Topical Meeting, 1997. ODS. Conference Digest
Conference_Location :
Tucson, AZ, USA
Print_ISBN :
0-7803-3885-5
DOI :
10.1109/ODS.1997.606144
