Title :
STIL from the users perspective
Author :
Maston, Gregory A.
Author_Institution :
Application Specific Integrated Circuits Div., Motorola Inc., Chandler, AZ, USA
Abstract :
The author discusses the strong motivations for a standard test language. The capabilities of the Standard Test Interface Language (STIL) are examined and compared with other test standards which go too far into additional aspects of test
Keywords :
IEEE standards; application specific integrated circuits; automatic test software; computer testing; integrated circuit testing; software standards; ASIC testing; Standard Test Interface Language; microprocessor testing; standard test language; test standards; test validation; users perspective; Application software; Application specific integrated circuits; Automatic testing; Circuit testing; Environmental management; Integrated circuit testing; Microprocessors; Production; Test equipment; Timing;
Conference_Titel :
Test Conference, 1995. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-2992-9
DOI :
10.1109/TEST.1995.529928
