DocumentCode
2060484
Title
STIL from the users perspective
Author
Maston, Gregory A.
Author_Institution
Application Specific Integrated Circuits Div., Motorola Inc., Chandler, AZ, USA
fYear
1995
fDate
21-25 Oct 1995
Firstpage
919
Abstract
The author discusses the strong motivations for a standard test language. The capabilities of the Standard Test Interface Language (STIL) are examined and compared with other test standards which go too far into additional aspects of test
Keywords
IEEE standards; application specific integrated circuits; automatic test software; computer testing; integrated circuit testing; software standards; ASIC testing; Standard Test Interface Language; microprocessor testing; standard test language; test standards; test validation; users perspective; Application software; Application specific integrated circuits; Automatic testing; Circuit testing; Environmental management; Integrated circuit testing; Microprocessors; Production; Test equipment; Timing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1995. Proceedings., International
Conference_Location
Washington, DC
ISSN
1089-3539
Print_ISBN
0-7803-2992-9
Type
conf
DOI
10.1109/TEST.1995.529928
Filename
529928
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