Title :
Digest report of the investigation committee on various problems with high reliability for insulation of electronic equipment
Author :
Tsukui, T. ; Yamano, Y. ; Shutoh, K. ; Yoda, S.
Author_Institution :
Tokai University
Keywords :
Circuit testing; Conductors; Electronic circuits; Electronic equipment; Electronic equipment testing; Insulation testing; Low voltage; Round robin; Surges; Wiring;
Conference_Titel :
Electrical Insulating Materials, 2001. (ISEIM 2001). Proceedings of 2001 International Symposium on
Print_ISBN :
4-88686-053-2
DOI :
10.1109/ISEIM.2001.973821
