• DocumentCode
    2060530
  • Title

    Digest report of the investigation committee on various problems with high reliability for insulation of electronic equipment

  • Author

    Tsukui, T. ; Yamano, Y. ; Shutoh, K. ; Yoda, S.

  • Author_Institution
    Tokai University
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    886
  • Lastpage
    886
  • Keywords
    Circuit testing; Conductors; Electronic circuits; Electronic equipment; Electronic equipment testing; Insulation testing; Low voltage; Round robin; Surges; Wiring;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulating Materials, 2001. (ISEIM 2001). Proceedings of 2001 International Symposium on
  • Print_ISBN
    4-88686-053-2
  • Type

    conf

  • DOI
    10.1109/ISEIM.2001.973821
  • Filename
    973821