Title :
Reflection characteristics of nanoscopic layered structures and optical diagnostics of ultrathin dielectric films
Author_Institution :
Inst. of Phys., Tartu Univ., Estonia
Abstract :
The contribution of an N-layer system of ultrathin inhomogeneous dielectric films to the reflection characteristics of linearly polarized light is investigated in long-wave limit. The novel methods are developed for determining the parameters of nanometer-size dielectric films upon homogeneous transparent materials by using the differential reflectance.
Keywords :
dielectric polarisation; dielectric thin films; nanostructured materials; optical constants; permittivity; reflectivity; differential reflectance; homogeneous transparent materials; linearly polarized light; nanometer size dielectric films; nanoscopic layered structures; optical diagnostics; reflection property; ultrathin inhomogeneous dielectric films; Dielectric constant; Dielectric films; Dielectric substrates; Electromagnetic reflection; Nanostructures; Nonhomogeneous media; Nonlinear optics; Optical films; Optical reflection; Reflectivity;
Conference_Titel :
Nanotechnology, 2003. IEEE-NANO 2003. 2003 Third IEEE Conference on
Print_ISBN :
0-7803-7976-4
DOI :
10.1109/NANO.2003.1231044
