DocumentCode
2060564
Title
Reflection characteristics of nanoscopic layered structures and optical diagnostics of ultrathin dielectric films
Author
Adamson, P.
Author_Institution
Inst. of Phys., Tartu Univ., Estonia
Volume
2
fYear
2003
fDate
12-14 Aug. 2003
Firstpage
836
Abstract
The contribution of an N-layer system of ultrathin inhomogeneous dielectric films to the reflection characteristics of linearly polarized light is investigated in long-wave limit. The novel methods are developed for determining the parameters of nanometer-size dielectric films upon homogeneous transparent materials by using the differential reflectance.
Keywords
dielectric polarisation; dielectric thin films; nanostructured materials; optical constants; permittivity; reflectivity; differential reflectance; homogeneous transparent materials; linearly polarized light; nanometer size dielectric films; nanoscopic layered structures; optical diagnostics; reflection property; ultrathin inhomogeneous dielectric films; Dielectric constant; Dielectric films; Dielectric substrates; Electromagnetic reflection; Nanostructures; Nonhomogeneous media; Nonlinear optics; Optical films; Optical reflection; Reflectivity;
fLanguage
English
Publisher
ieee
Conference_Titel
Nanotechnology, 2003. IEEE-NANO 2003. 2003 Third IEEE Conference on
Print_ISBN
0-7803-7976-4
Type
conf
DOI
10.1109/NANO.2003.1231044
Filename
1231044
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