DocumentCode :
2060571
Title :
Optimizing product profitability-the test way
Author :
Varma, Prab
Author_Institution :
CrossCheck Technol. Inc., San Jose, CA, USA
fYear :
1995
fDate :
21-25 Oct 1995
Firstpage :
922
Abstract :
The competitive drive to reduce product development costs has led to a surge of interest in test methods that attempt to reduce costs. However, reducing test costs may not always result in the lowest product costs. Rather than attempting to reduce test costs as much as possible, the goal should be to maximize product profitability by finding the optimum test strategy that results in the quality levels desired for the lowest product cost and the highest product revenues
Keywords :
boundary scan testing; costing; design for testability; economics; product development; production testing; DFT; highest product revenues; life cycle costs; lowest product cost; optimum test strategy; partial scan; product development costs; product profitability optimization; test costs; test methods; time to market; Circuit testing; Cost function; Design for testability; Ducts; Life testing; Product development; Profitability; Silicon; Surges; Time to market;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 1995. Proceedings., International
Conference_Location :
Washington, DC
ISSN :
1089-3539
Print_ISBN :
0-7803-2992-9
Type :
conf
DOI :
10.1109/TEST.1995.529931
Filename :
529931
Link To Document :
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