What´s so different about deep-submicron test?

Functional verification of products is attetmpting to prove the absence of logical defects in a design, while test is attempting to prove the absence of physical defects in the same design. Both have many common needs; both are critical to the design and development of our products. Validating the state of a device or product has become all but impossible, without direct access to the internal state of the device. Scan based diagnostic techniques are now being used at the board, system and software debug and development stages of product development cycles; these are the same requirements that device test has always had. The implication is to enable the use of on-chip test structures and features for more than just the manufacturing process. As these on-chip features become more prevalent, their standardization and proliferation will be the norm rather than the exception. As such, advancements in diagnostics and built-in self verifying (and testing) devices and products, can and will become the dominant strategy optimizing time to market of our products, ultimately allowing our customers to becomes more successful