Effect of EM beam angle-width on cross polarized backscattering from slightly rough dielectric surfaces

Through analysis of a rigorous vectorial EM beam model, new formulas for simulating cross polarized backscattering coefficients of rough dielectric surfaces to EM beams are developed. The formulas reveal the considerable effect of EM beam angle-width on cross polarized backscattering, which is related to single backscattering. Comparison with measured data for two different randomly slightly rough soil surfaces shows that numerical simulations including a contribution from beam angle-width effect are much reasonable than the numerical simulations without such an effect