• DocumentCode
    2060745
  • Title

    Model-driven development of reliable avionics architectures for Lunar Surface Systems

  • Author

    Borer, N. ; Claypool, I. ; Clark, D. ; West, J. ; Odegard, R. ; Somervill, K. ; Suzuki, N.

  • Author_Institution
    Charles Stark Draper Lab., Cambridge, MA, USA
  • fYear
    2010
  • fDate
    6-13 March 2010
  • Firstpage
    1
  • Lastpage
    21
  • Abstract
    This paper discusses a method used for the systematic improvement of NASA´s Lunar Surface Systems avionics architectures in the area of reliability and fault-tolerance. This approach utilizes an integrated system model to determine the effects of component failure on the system´s ability to provide critical functions. A Markov model of the potential degraded system modes is created to characterize the probability of these degraded modes, and the system model is run for each Markov state to determine its status (operational or system loss). The probabilistic results from the Markov model are first produced from state transition rates based on NASA data for heritage failure rate data of similar components. An additional set of probabilistic results are created from a representative set of failure rates developed for this study, for a variety of component quality grades (space-rated, mil-spec, ruggedized, and commercial). The results show that careful application of redundancy and selected component improvement should result in Lunar Surface Systems architectures that exhibit an appropriate degree of fault-tolerance, reliability, performance, and affordability.
  • Keywords
    Markov processes; avionics; fault tolerance; probability; redundancy; Markov model; NASA lunar surface systems avionics; fault tolerance; integrated system; probability; redundancy; reliability; state transition rates; Aerospace electronics; Degradation; Failure analysis; Fault tolerant systems; Humans; Laboratories; Mathematical model; Moon; NASA; Performance analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Aerospace Conference, 2010 IEEE
  • Conference_Location
    Big Sky, MT
  • ISSN
    1095-323X
  • Print_ISBN
    978-1-4244-3887-7
  • Type

    conf

  • DOI
    10.1109/AERO.2010.5446723
  • Filename
    5446723