Title :
End-to-end test strategy for wireless systems
Author :
Jarwala, Madhuri ; Le, Duy ; Heutmaker, Michael S.
Author_Institution :
AT&T Bell Labs., Princeton, NJ, USA
Abstract :
This paper proposes an end-to-end test strategy for wireless systems described by using wireless microcell as a vehicle. It presents a framework for resting digital and radio frequency (RF) boards in a wireless system and provides an integrated solution. The test strategy is based on two concepts: using boundary-scan for digital testing, and using boundary-scan to provide a gateway for DSP-based functional testing of RF circuits. The test signals are generated within the system and the test control and verification are also provided by the system leading to system self-test
Keywords :
automatic test equipment; automatic testing; boundary scan testing; cellular radio; fault diagnosis; mobile communication; personal communication networks; printed circuit testing; telecommunication equipment testing; DSP; RF circuits; boundary-scan; cellular radio; digital boards; digital testing; end-to-end test strategy; functional testing; microcell architecture; personal communication network; radio frequency boards; system self-test; test control; verification; wireless microcell; wireless systems; Automatic testing; Built-in self-test; Circuit testing; Control systems; Costs; Logic testing; Manufacturing processes; Microcell networks; Radio frequency; System testing;
Conference_Titel :
Test Conference, 1995. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-2992-9
DOI :
10.1109/TEST.1995.529940
