Title :
Automated 1.5 GHz SONET characterization
Author :
Tepper, Rob ; Tarpo, Jim
Author_Institution :
Appl. Micro Circuits Corp., San Diego, CA, USA
Abstract :
While functional, D.C. parametric and limited at-speed testing of integrated circuits is typically done on commercially available test systems, these systems are not rated for SONET frequencies and do not lend themselves well to product characterization. This paper describes a test methodology and system designed specifically to address at-speed SONET characterization requirements
Keywords :
SONET; application specific integrated circuits; automatic test equipment; automatic test software; automatic testing; data analysis; electronic engineering computing; integrated circuit testing; production testing; telecommunication equipment testing; 1.5 GHz; ASIC; ATE; D.C. parametric testing; SONET characterization; SONET frequencies; at-speed SONET characterization; limited at-speed testing; product characterization; test methodology; Bit error rate; Circuit testing; Clocks; Frequency; Integrated circuit technology; Integrated circuit testing; SONET; System testing; Throughput; Transmitters;
Conference_Titel :
Test Conference, 1995. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-2992-9
DOI :
10.1109/TEST.1995.529942
