• DocumentCode
    2060927
  • Title

    From specification validation to hardware testing: a unified method

  • Author

    Hayek, Ghassan Al ; Robach, Chantal

  • Author_Institution
    LSR, IMAG, Grenoble, France
  • fYear
    1996
  • fDate
    20-25 Oct 1996
  • Firstpage
    885
  • Lastpage
    893
  • Abstract
    With the great advancement in the design automation field, actual tools allow to describe hardware systems as software programs using high-level hardware description languages such as VHDL or VERILOG. Consequently, a design fault which affects the system specification can be considered as a software fault. To test the system specification against (software) design faults, we propose in this paper an adaptation of the mutation analysis, originally proposed for software testing, to test VHDL functional descriptions. The resulted test set is applied on the gate-level structure of the system to measure its capacity to uncover hardware faults such as the stuck-at faults. Heuristics to enhance the test set in order to be sufficient for testing hardware faults are presented and results are compared to traditional ATPGs. Accordingly, this paper presents a unified method for testing both the system specification and the hardware implementation
  • Keywords
    VLSI; automatic testing; design for testability; hardware description languages; high level languages; integrated circuit testing; logic testing; ATPG; VERILOG; VHDL; design fault; esign automation; gate-level structure; hardware testing; high-level hardware description languages; mutation analysis; software fault; software programs; software testing; specification validation; stuck-at faults; system specification; unified method; Automatic testing; Circuit faults; Circuit testing; Design automation; Hardware design languages; Performance evaluation; Software systems; Software testing; System testing; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1996. Proceedings., International
  • Conference_Location
    Washington, DC
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-3541-4
  • Type

    conf

  • DOI
    10.1109/TEST.1996.557150
  • Filename
    557150