Title :
Demonstration of a Flow-Through Micro-PCR in an Annular Pyrex Channel
Author :
Mock, James E. ; Gordon, M.H. ; Bradley, William W.
Author_Institution :
Univ. of Arkansas, Fayetteville
Abstract :
A device is presented that demonstrates the feasibility of performing polymerase chain reaction (PCR) DNA amplification in an annular channel. A known temperature and time profile for non-pathogenic Escherichia coli (E. coli) amplification is used, but the design can accommodate the amplification of any genetic sample. Design parameters were established from the requirements for PCR amplification. These were then used to develop computer simulations using ANSYS software. The results from the simulations are used to create a relatively large testing device to confirm the model. Once experimentally verified, a similar model will be used to design a more compact, hand-held micro total analysis system (mu-TAS). Initial results from computer models indicate that an annular design micro-PCR is capable of maintaining three distinct temperature zones. The time required to bring the device from room temperature to operating temperature was found to be approximately 2 hours and 40 minutes using operating powers for the heaters. The presented device had an annulus with a diameter of 3.81 cm. Preliminary results for smaller dimensions indicate that the temperatures can also be maintained for smaller sizes but may require active cooling.
Keywords :
DNA; bioMEMS; biochemistry; biological techniques; biothermics; cellular biophysics; genetics; microchannel flow; molecular biophysics; ANSYS software; DNA amplification; annular Pyrex channel; flow-through micro-PCR; genetics; micro total analysis system; nonpathogenic Escherichia coli; polymerase chain reaction; size 3.81 cm; temperature profile; time profile; Biological materials; Conducting materials; DNA; Genetics; Glass; Magnetohydrodynamics; Polymers; Temperature; Testing; Thermal conductivity; Lab-on-chip; PCR; bio MEMS; micro fluidics;
Conference_Titel :
Region 5 Technical Conference, 2007 IEEE
Conference_Location :
Fayetteville, AR
Print_ISBN :
978-1-4244-1280-8
Electronic_ISBN :
978-1-4244-1280-8
DOI :
10.1109/TPSD.2007.4380399