DocumentCode :
2061060
Title :
Unascertained rational number method applied to assess voltage sag in distribution system
Author :
Hu Shan-Shan ; Xiao Xian-Yong ; Wang Ying ; Feng Gang ; Chen Tian-Li
Author_Institution :
Coll. of Electr. Eng. & Inf. Technol., Sichuan Univ., Chengdu, China
fYear :
2012
fDate :
10-14 Sept. 2012
Firstpage :
1
Lastpage :
4
Abstract :
Aiming at the uncertainty in the process of assessment voltage sag frequency in the distribution network (such as reliability parameters), combined with unascertained mathematics, this paper proposed an unascertained mathematics method to depict the uncertainty of the reliability parameters. Based on the traditional fault location method, a new unascertained mathematics assessment model and an approach were presented to assess the occurrence frequency due to voltage sags. This paper is focus on the uncertainties of the failure rate of system components in the process of assessment voltage sag frequency. The proposed method had been applied to the simple 9-node test system. Compared with the current deterministic and interval number methods, the simulation results have shown that this method is correct and usable, the existing point value evaluation method is a special case of the unascertained number evaluation method, the new methods provide more information.
Keywords :
fault location; mathematical analysis; power distribution reliability; power supply quality; 9-node test system; current deterministic methods; distribution network; distribution system; failure rate; fault location method; interval number methods; number evaluation method; point value evaluation method; reliability parameters; system components; unascertained mathematics method; unascertained rational number method; voltage sag frequency assessment; Unascertained mathematics; stochastic estimation; uncertainty; voltage sag; voltage sag Frequency;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electricity Distribution (CICED), 2012 China International Conference on
Conference_Location :
Shanghai
ISSN :
2161-7481
Print_ISBN :
978-1-4673-6065-4
Electronic_ISBN :
2161-7481
Type :
conf
DOI :
10.1109/CICED.2012.6508605
Filename :
6508605
Link To Document :
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