DocumentCode
2061225
Title
Wire sweep control with mold compound formulations [plastic packaging]
Author
Nguyen, L. ; Jackson, J. ; Teo, C.H. ; Chillara, S. ; Asanasavest, C. ; Burke, T. ; Walberg, R. ; Lo, R. ; Weiler, P. ; Ho, D. ; Rauhut, H.
Author_Institution
Nat. Semicond. Corp., Santa Clara, CA, USA
fYear
1997
fDate
18-21 May 1997
Firstpage
60
Lastpage
71
Abstract
Twenty different epoxy compound formulations were evaluated to assess the moldability and the resulting wire sweep propensity in a manual gang-pot molding machine. Effects such as filler content, filler shape and size, hardener viscosity, catalyst level, resin type, and thixotropic index were considered. Results obtained on a 160-lead PQFP with wire lengths up to 160 mils helped reduce the selection down to 5 formulations, which were then tested in a fully automated gang-pot system in a production environment. Aside from wire sweep, effects on die pad shift was also considered. This paper will discuss the relationship between the compound formulations, moldability, wire sweep, and pad shift. Although results were obtained on a test die with 100 μm pad pitch, the information garnered should be extendible down to finer pitch
Keywords
encapsulation; integrated circuit manufacture; integrated circuit packaging; plastic packaging; polymers; 160-lead PQFP; catalyst level; die pad shift; epoxy compound formulations; filler content; filler shape; filler size; hardener viscosity; manual gang-pot molding machine; mold compound formulations; moldability; plastic QFP; production environment; resin type; thixotropic index; wire sweep control; Bonding; Deformable models; Electronics packaging; Encapsulation; Manuals; Packaging machines; Retirement; Semiconductor device packaging; Shape; Wire;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference, 1997. Proceedings., 47th
Conference_Location
San Jose, CA
ISSN
0569-5503
Print_ISBN
0-7803-3857-X
Type
conf
DOI
10.1109/ECTC.1997.606147
Filename
606147
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