• DocumentCode
    2061749
  • Title

    5.7 A 29nW bandgap reference circuit

  • Author

    Jong Mi Lee ; Youngwoo Ji ; Seungnam Choi ; Young-Chul Cho ; Seong-Jin Jang ; Joo Sun Choi ; Byungsub Kim ; Hong-June Park ; Jae-Yoon Sim

  • Author_Institution
    Pohang Univ. of Sci. & Technol., Pohang, South Korea
  • fYear
    2015
  • fDate
    22-26 Feb. 2015
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    Bandgap references (BGRs) are widely used to generate a temperature-insensitive reference voltage determined by the silicon bandgap. the BGR generally utilizes PN diodes to generate both of proportional-to-absolute-temperature (PTAT) and complementary-to-absolute-temperature (CTAT) quantities and combines them to eliminate the temperature dependency. Though the BGR provides a robust voltage or current reference with insensitivity to process, voltage and temperature variations that is superior to CMOS-only reference circuits, it has received little attention in ultra-low-power (ULP) sensor applications. While CMOS-only reference circuits have recently demonstrated nanowatt power consumption, BGR approaches still have two critical factors to preventing nanowatt consumption. One is that PTAT generation assumes sufficient forward bias, VD, of the PN junction to allow eVD/(n·VT) to be much larger than 1 in the temperature range of interest, where n and VT (=kT/q) represent the ideality factor and the thermal voltage, respectively. In addition, the PTAT generation requires a start-up circuit to prevent the circuit from resting at the undesirable zero-bias condition. Since the start-up circuit utilizes a resistive voltage division between power rails, it consumes non-zero DC current, which must be larger than leakage current in order to ensure stable start-up operation. These two requirements for PTAT generation limit the use of BGRs in nanowatt ULP applications.
  • Keywords
    low-power electronics; reference circuits; CTAT quantity; PTAT quantity; bandgap reference circuit; complementary-to-absolute-temperature quantity; power 29 nW; process insensitive reference; proportional-to-absolute-temperature quantity; resistive voltage division; robust current reference; robust voltage reference; silicon bandgap; temperature insensitive reference voltage; Leakage currents; Photonic band gap; Solid state circuits; Temperature dependence; Temperature measurement; Temperature sensors; Voltage measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid- State Circuits Conference - (ISSCC), 2015 IEEE International
  • Conference_Location
    San Francisco, CA
  • Print_ISBN
    978-1-4799-6223-5
  • Type

    conf

  • DOI
    10.1109/ISSCC.2015.7062945
  • Filename
    7062945