DocumentCode :
2062194
Title :
7.7 Enterprise-grade 6x fast read and 5x highly reliable SSD with TLC NAND-flash memory for big-data storage
Author :
Tokutomi, Tsukasa ; Doi, Masafumi ; Hachiya, Shogo ; Kobayashi, Atsuro ; Tanakamaru, Shuhei ; Takeuchi, Ken
Author_Institution :
Chuo Univ., Tokyo, Japan
fYear :
2015
fDate :
22-26 Feb. 2015
Firstpage :
1
Lastpage :
3
Abstract :
An enterprise-grade SSD with TLC (3b/cell) NAND Flash is presented with three techniques that achieve high speed and high reliability. Quick low-density parity-check (LDPC) reduces the read latency of 1Xnm TLC NAND Flash SSD by 83%. Dynamic VTH optimization and auto data recovery reduce the NAND Flash bit-error rate (BER) by 80% and 18%, respectively. These techniques can be implemented in the SSD controller without circuit overhead. No modification is required to the TLC NAND flash.
Keywords :
Big Data; dynamic programming; error statistics; flash memories; BER; Big-Data storage; LDPC; NAND flash bit-error rate reduction; TLC NAND flash SSD controller; TLC NAND-flash memory; autodata recovery; circuit overhead; dynamic VTH optimization; enterprise-grade SSD; low-density parity-check; read latency reduction; Bit error rate; Error correction codes; Flash memories; Optimization; Parity check codes; Reliability; Sensors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid- State Circuits Conference - (ISSCC), 2015 IEEE International
Conference_Location :
San Francisco, CA
Print_ISBN :
978-1-4799-6223-5
Type :
conf
DOI :
10.1109/ISSCC.2015.7062965
Filename :
7062965
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2062194
بازگشت