DocumentCode :
2062252
Title :
Research on the Profile Matching of New or Worn Wheel/Rail
Author :
Xiaoping, Jia ; Wei, Zhao ; Jun, Zhang ; Chunyan, Wang
Author_Institution :
Province Key Lab. of Vehicle Eng. Adv. Technol., Dalian Jiaotong Univ., Dalian, China
Volume :
3
fYear :
2010
fDate :
14-15 Aug. 2010
Firstpage :
291
Lastpage :
294
Abstract :
General profiles chosen from worn wheel profiles and railheads (briefly, worn wheel and rail profile) measured by wheel-rail profile admeasuring apparatus were used to build the finite element models, and the new/worn wheel-rail contact problems were analyzed respectively on the tangent and curved track. Variable regulations of contact area´s size, shape and position were generalized. The results show that, on the tangent and curved track, contact area´s acreage is small and the peak point of equivalent stress is large occur in the model of new wheel-old rail, which indicates that turning worn wheel profile into original profile is unreasonable. Compared with other models, the contact model of old wheel-old rail shows the largest contact area´s size, and such wheel-rail matching is the best one, which provides references for designing the turned wheel profile to adapt to worn railhead profile and reducing the wear of wheel and railhead profile.
Keywords :
finite element analysis; mechanical contact; rails; railway engineering; stress analysis; wear; wheels; contact area position; contact area shape; contact area size; curved track; finite element model; profile matching; stress; tangent track; turned wheel profile; wear; wheel-rail contact; wheel-rail matching; wheel-rail profile admeasuring apparatus; worn railhead profile; worn wheel profile; Finite element methods; Flanges; Force; Rails; Shape; Stress; Wheels; FEM; Profile matching; Wear; Wheel-rail contact;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Information Engineering (ICIE), 2010 WASE International Conference on
Conference_Location :
Beidaihe, Hebei
Print_ISBN :
978-1-4244-7506-3
Electronic_ISBN :
978-1-4244-7507-0
Type :
conf
DOI :
10.1109/ICIE.2010.246
Filename :
5571552
Link To Document :
بازگشت