DocumentCode :
2062355
Title :
8.4 A 0.33V/-40°C process/temperature closed-loop compensation SoC embedding all-digital clock multiplier and DC-DC converter exploiting FDSOI 28nm back-gate biasing
Author :
Clerc, Sylvain ; Saligane, Mehdi ; Abouzeid, Fady ; Cochet, Martin ; Daveau, Jean-Marc ; Bottoni, Cyril ; Bol, David ; De-Vos, Julien ; Zamora, Dominique ; Coeffic, Benjamin ; Soussan, Dimitri ; Croain, Damien ; Naceur, Mehdi ; Schamberger, Pierre ; Roche
Author_Institution :
STMicroelectron., Crolles, France
fYear :
2015
fDate :
22-26 Feb. 2015
Firstpage :
1
Lastpage :
3
Abstract :
A 32b SoC is designed in 28nm FDSOI to operate in either an energy-efficiency (EE) mode, at 0.45V, or low-leakage (LL) mode, at 0.33V, with process-temperature compensation. At near threshold, it overcomes low transistor current at negative temperatures, the need for an extra digital supply IO, and the clocking power costs faced by the internet-of-things (IoT) and wearable systems. The system includes: 1) an all-digital single-supply open-loop clock multiplier achieving 1.51 pJ/cycle; 2) a 0.33V/0.45V dual-mode switched-network-capacitor DC-DC down converter from a 1.1V logic supply, reaching 75% conversion efficiency in both modes; 3) a closed-loop low-invasiveness timing monitoring system dynamically compensating device centering and temperature changes, enabling constant frequency operation down to -40°C at 20MHz (1MHz) in EE (LL) mode. The system fully exploits forward body bias (FBB) available in 28nm UTBB FDSOI with LVT transistors.
Keywords :
DC-DC power convertors; compensation; multiplying circuits; silicon-on-insulator; switched capacitor networks; system-on-chip; DC-DC converter; DC-DC down converter; FDSOI back-gate biasing; Internet-of-things; LVT transistors; SoC; UTBB FDSOI; all-digital clock multiplier; dual-mode switched-network-capacitor; energy-efficiency mode; forward body bias; logic supply; low transistor current; low-leakage mode; negative temperature; open-loop clock multiplier; process-temperature compensation; size 28 nm; storage capacity 32 bit; temperature -40 C; temperature closed-loop compensation; voltage 0.33 V; voltage 0.45 V; voltage 1.1 V; wearable system; Clocks; Energy efficiency; Frequency conversion; Generators; Jitter; Switches; System-on-chip;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid- State Circuits Conference - (ISSCC), 2015 IEEE International
Conference_Location :
San Francisco, CA
Print_ISBN :
978-1-4799-6223-5
Type :
conf
DOI :
10.1109/ISSCC.2015.7062970
Filename :
7062970
Link To Document :
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