• DocumentCode
    2062907
  • Title

    The effect of filler on the properties of molding compounds and their moldability

  • Author

    Ko, Minjin ; Kim, Myungwhan ; Shin, Dongsuk ; Lim, Inhee ; Moon, Myungsun ; Park, Yongjoon

  • Author_Institution
    Electron. Mater. Res. Inst., Taejon, South Korea
  • fYear
    1997
  • fDate
    18-21 May 1997
  • Firstpage
    108
  • Lastpage
    113
  • Abstract
    High loading of filler is known as an effective method for lowering the moisture absorption of the encapsulating compound since the filler itself does not absorb moisture. This also significantly increases the mechanical strength of the cured compound at reflow temperature. However, the detailed effect of the filler on the characteristic of the encapsulating compound was not fully disclosed. In this paper, the encapsulating compounds filled with an amorphous silica were prepared to study their characteristics relating to the reliability of an IC package and its workability. We have investigated the effect of the filler size and shape on the flowability of the compound. Both ultra fine and more spherical shaped filler are very effective to increase the spiral flow. We have also examined the properties of the encapsulating compound containing the filler chemically modified with the different silanes. The study reveals that the modification of the filler with reactive silane chemicals has a great influence on the properties of the compound including the mechanical strength, flowability, the flash/bleed and the shelf life. So, the proper modification of the filler is critical for balancing the reliability and moldability of an IC package
  • Keywords
    encapsulation; filled polymers; integrated circuit packaging; integrated circuit reliability; mechanical strength; moisture; plastic packaging; IC package; SiO2; amorphous silica filler; encapsulating compound; epoxy resins; filler size; flowability; mechanical strength; moisture absorption; moldability; molding compounds; plastic packaging; reliability; shelf life; spiral flow; workability; Absorption; Amorphous materials; Chemical compounds; Integrated circuit packaging; Moisture; Shape; Silicon compounds; Spirals; Temperature; Workability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 1997. Proceedings., 47th
  • Conference_Location
    San Jose, CA
  • ISSN
    0569-5503
  • Print_ISBN
    0-7803-3857-X
  • Type

    conf

  • DOI
    10.1109/ECTC.1997.606154
  • Filename
    606154