Title :
11.4 A 67,392-SPAD PVTB-compensated multi-channel digital SiPM with 432 column-parallel 48ps 17b TDCs for endoscopic time-of-flight PET
Author :
Carimatto, Augusto ; Mandai, Shingo ; Venialgo, Esteban ; Ting Gong ; Borghi, Giacomo ; Schaart, Dennis R. ; Charbon, Edoardo
Author_Institution :
Delft Univ. of Technol., Delft, Netherlands
Abstract :
Positron emission tomography (PET) is a medical imaging technique for non-invasive detection of glucose metabolism in human organs, such as the brain, heart, and lungs. A positron-emitting molecule, generally Fluorodeoxyglucose-18 (18F-FDG), is injected and subsequently identified by coincident detection of two gamma photons released during the annihilation of an electron with the positron lost by 1BF-FDG. Conventionally, coincident gamma photons are detected through scintillation by two sensors placed at 180° in a ring of identical sensors. In EndoTOFPET-US, two sensors are used, one placed in a semicircular ring outside the patient and the other placed on an endoscope. The endoscopic sensor is a miniaturized array of silicon photomultipliers (SiPMs) coupled to a mini-scintillator. To exploit the Fishburn-Seifert lower bound in timing resolution, a large number of photon timestamps must be generated, as is done in a multi-channel digital SiPM (MD-SiPM).
Keywords :
biomedical imaging; elemental semiconductors; endoscopes; photomultipliers; positron emission tomography; silicon; sugar; time-digital conversion; EndoTOFPET-US; Fishburn-Seifert lower bound; Fluorodeoxyglucose-18; SPAD PVTB-compensation; Si; coincident gamma photons; column-parallel TDC; endoscopic time-of-flight PET; endoscopie sensor; glucose metabolism; human organs; medical imaging; multichannel digital SiPM; noninvasive detection; photon timestamps; positron emission tomography; positron-emitting molecule; semicircular ring; silicon photomultipliers; time-to-digital converters; Arrays; Detectors; Generators; Photonics; Positron emission tomography; Timing;
Conference_Titel :
Solid- State Circuits Conference - (ISSCC), 2015 IEEE International
Conference_Location :
San Francisco, CA
Print_ISBN :
978-1-4799-6223-5
DOI :
10.1109/ISSCC.2015.7062996