Title :
Identifying individual process patterns by means of non-invasive measurements: preliminary results
Author :
Colombo, Alberto ; Damiani, Ernesto ; Gianini, Gabriele ; Scotto, Marco ; Sued, G.
Author_Institution :
Dept. of Inf. Technol., Milan Univ., Italy
Abstract :
So far there have been limited attempts to model the individual development patterns, however, non invasive measurements techniques, by providing a very detailed view of how people operate, open the door to completely new opportunities for understanding the behavior of developers. This study reports about the analysis of the development process patterns of a limited set of programmers across a few months of activity by using the time structure of the events produced within the programmers´ developing environments. Preliminary findings hint for an event production dynamics characterized by long range correlations.
Keywords :
object-oriented programming; programming environments; software metrics; development process pattern; event production dynamics; events time structure; noninvasive measurement; programmers developing environment; Authentication; Chromium; Information technology; Measurement techniques; Microwave integrated circuits; Pattern analysis; Probes; Production; Programming profession; Switches;
Conference_Titel :
Computational Cybernetics, 2005. ICCC 2005. IEEE 3rd International Conference on
Print_ISBN :
0-7803-9122-5
DOI :
10.1109/ICCCYB.2005.1511560