DocumentCode :
2063123
Title :
Unpowered opens test with X-ray laminography
Author :
Oresjo, Stig
Author_Institution :
Hewlett-Packard Co., Loveland, CO, USA
fYear :
1996
fDate :
20-25 Oct 1996
Firstpage :
929
Abstract :
The author briefly describes how X-ray laminography can be used to detect solder opens. With this method X-ray images are taken of the device under test (DUT). The lead content in solder makes the solder joints appear clearly in the image. Using image processing algorithms and also calibration information, the captured image of the solder joint is automatically translated into key mechanical measurements of the solder joint, such as heel height, center height, toe height, average height, fillet length and width at the toe and the heel. A key difference in this method is that these mechanical characteristics of the solder joint are used by the image processor to automatically determine an open solder joint from a good solder joint
Keywords :
X-ray applications; automatic testing; fault location; image processing; printed circuit testing; DUT; X-ray images; X-ray laminography; average height; calibration; center height; fillet length; fillet length and width; heel height; image processing algorithms; lead content; mechanical characteristics; opens test; solder joint; solder opens; toe height; Calibration; Image processing; Lead; Length measurement; Mechanical variables measurement; Soldering; Testing; X-ray detection; X-ray detectors; X-ray imaging;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 1996. Proceedings., International
Conference_Location :
Washington, DC
ISSN :
1089-3539
Print_ISBN :
0-7803-3541-4
Type :
conf
DOI :
10.1109/TEST.1996.557159
Filename :
557159
Link To Document :
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