Fault Models and Yield Analysis for QCA-Based PLAs

Various implementations of the quantum-dot cellular automata (QCA) device architecture may help many performance scaling trends continue as we approach the nano-scale. Experimental success has led to the evolution of a research track that looks at QCA-based design. The work presented in this paper follows that track and looks at implementation friendly, programmable QCA circuits. Specifically, we analyze a novel, QCA-based, programmable logic array (PLA) structure, develop an implementation independent fault model, discuss how expected defects and faults might affect yield, and look at the design in the context of a magnetic implementation of QCA.