Title :
Observer based junction temperature estimator in thermoelectrical aging
Author :
Ginart, Antonio ; Ali, Irfan N. ; Barlas, Irtaza ; Kalgren, Patrick W. ; Roemer, Michael J. ; Goebel, Kai
Author_Institution :
Impact Technol., Rochester, NY, USA
Abstract :
Transistor thermal model is nonlinear and highly dependent upon temperature. For reliability assessments, accurate estimation of the junction temperature is especially critical. This paper proposes a novel approach that employs an observer during thermoelectrical aging for estimation of the junction temperature based on available and measurable temperature data.
Keywords :
ageing; observers; semiconductor device reliability; thermoelectricity; transistors; observer based junction temperature estimator; reliability assessment; thermoelectrical aging; transistor thermal model; Accelerated aging; Circuit testing; Degradation; Equations; Radio frequency; Semiconductor materials; Temperature dependence; Temperature measurement; Thermal variables measurement; Thermoelectricity;
Conference_Titel :
Aerospace Conference, 2010 IEEE
Conference_Location :
Big Sky, MT
Print_ISBN :
978-1-4244-3887-7
Electronic_ISBN :
1095-323X
DOI :
10.1109/AERO.2010.5446831
