Title :
Proceedings of the 17th IEEE Instrumentation and Measurement Technology Conference [Cat. No. 00CH37066]
Abstract :
The following topics were dealt with. Moisture measurements; power measurements; sensors; communication technology; ADC testing; temperature measurements; power convertors; medical applications; VLSI; DSP; standards; magnetic materials measurement; imaging systems; impedance measurements; laser measurements; microwave measurement; mixed-signal testing; system identification; imaging techniques; nonlinear systems; control systems; virtual instrumentation; vibration testing; time domain measurements; data fusion; semiconductor quality measurement; and NDT
Keywords :
dynamic testing; electric impedance measurement; integrated circuit testing; magnetic materials; measurement by laser beam; microwave measurement; mixed analogue-digital integrated circuits; moisture measurement; nondestructive testing; power measurement; quality control; sensor fusion; sensors; standards; temperature measurement; time-domain analysis; ADC testing; DSP; NDT; VLSI; communication technology; control systems; data fusion; imaging systems; imaging techniques; impedance measurements; laser measurements; magnetic materials measurement; medical applications; microwave measurement; mixed-signal testing; moisture measurements; nonlinear systems; power convertors; power measurements; semiconductor quality measurement; sensors; standards; system identification; temperature measurements; time domain measurements; vibration testing; virtual instrumentation;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2000. IMTC 2000. Proceedings of the 17th IEEE
Conference_Location :
Baltimore, MD, USA
Print_ISBN :
0-7803-5890-2
DOI :
10.1109/IMTC.2000.846800
