• DocumentCode
    2063563
  • Title

    A new calibration technique for microwave moisture sensors

  • Author

    Trabelsi, Samir ; Krazsewski, Andrzej W. ; Nelson, Stuart O.

  • Author_Institution
    Richard B. Russell Agric. Res. Center, US Dept. of Agric., Athens, GA, USA
  • Volume
    1
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    8
  • Abstract
    A new calibration technique was developed for implementation in microwave moisture sensors. The calibration permittivity function used for this purpose allows computation of moisture content in granular materials with significant differences in shape, dimensions and composition independent of bulk density and with temperature compensation. A three-dimensional representation is used to plot the calibration permittivity function as it depends on temperature and moisture content in wheat and corn. For each material, data points form a surface that is a plane. These planes have nearly the same coefficients which can be utilized for the development of a “universal” calibration method for moisture sensing in natural and manufactured granular materials. Foundations of the method are discussed, based on results obtained for wheat and corn over a wide temperature range and at moisture contents of practical interest
  • Keywords
    agriculture; calibration; compensation; granular materials; microwave measurement; moisture measurement; permittivity measurement; radiometers; calibration permittivity function; calibration technique; corn; granular materials; microwave moisture sensors; moisture content; temperature compensation; three-dimensional representation; universal calibration method; wheat; wide temperature range; Calibration; Composite materials; Manufacturing; Microwave sensors; Microwave theory and techniques; Moisture; Permittivity; Shape; Temperature dependence; Temperature sensors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference, 2000. IMTC 2000. Proceedings of the 17th IEEE
  • Conference_Location
    Baltimore, MD
  • ISSN
    1091-5281
  • Print_ISBN
    0-7803-5890-2
  • Type

    conf

  • DOI
    10.1109/IMTC.2000.846803
  • Filename
    846803