Title :
14.2 A physically unclonable function with BER <10−8 for robust chip authentication using oscillator collapse in 40nm CMOS
Author :
Kaiyuan Yang ; Qing Dong ; Blaauw, David ; Sylvester, Dennis
Author_Institution :
Univ. of Michigan, Ann Arbor, MI, USA
Abstract :
Security is a key concern in today\´s mobile devices and a number of hardware implementations of security primitives have been proposed, including true random number generators, differential power attack avoidance, and chip-ID generators [1-4]. Recently, physically unclonable functions (PUFs) were proposed as a secure method for chip authentication in unsecure environments [5-7]. A PUF is a function that maps an input code ("challenge\´) to an output code (“response”) in a manner that is unique for every chip. PUFs are increasingly used for IC authentication to offer protection against identity theft, cloning, and counterfeit components [2-4].
Keywords :
CMOS logic circuits; error statistics; integrated circuit design; mobile handsets; oscillators; BER; CMOS; IC authentication; PUF; bit error rate; chip authentication; chip-ID generators; counterfeit components; differential power attack avoidance; identity theft; mobile devices; oscillator collapse; physically unclonable function; random number generators; security primitives; size 40 nm; Authentication; Bit error rate; CMOS integrated circuits; Delays; High definition video; Oscillators; Temperature measurement;
Conference_Titel :
Solid- State Circuits Conference - (ISSCC), 2015 IEEE International
Conference_Location :
San Francisco, CA
Print_ISBN :
978-1-4799-6223-5
DOI :
10.1109/ISSCC.2015.7063022