DocumentCode :
2063629
Title :
14.5 A 1.22ps integrated-jitter 0.25-to-4GHz fractional-N ADPLL in 16nm FinFET CM0S
Author :
Tsung-Hsien Tsai ; Min-Shueh Yuan ; Chih-Hsien Chang ; Chia-Chun Liao ; Chao-Chieh Li ; Staszewski, Robert Bogdan
Author_Institution :
TSMC, Hsinchu, Taiwan
fYear :
2015
fDate :
22-26 Feb. 2015
Firstpage :
1
Lastpage :
3
Abstract :
All-digital phase-locked loops (ADPLLs) offer faster locking time, easier portability and better performance in advanced semiconductor processes as compared to analog PLLs. Advanced FinFET devices exhibit better gm and ION than planar devices [1], but they are offered only in a limited number of device sizes, thus precluding their use in traditional analog design styles. In an ADPLL, the transistors are used as switches with little regard to their linear analog properties. Hence, ADPLL performance should improve with the adoption of FinFET devices. Inverter delay in a 16nm FinFET process is less than half of that in a 28nm planar process, improving in-band phase noise (PN) by around 6dB [2]. Ring-type digitally controlled oscillators (DCOs) provide wide frequency tuning range (FTR), but poor PN performance degrades the ADPLL figure of merit (FoM) [3]. Achieving an FoM better than -225dB using a ring DCO is a challenge. In this work, we presenta 0.25-to-4GHz, 1.22ps integrated jitter and -228.6dB FoM fractional-N ADPLL with spread-spectrum clocking (SSC) capability in 16nm FinFET CMOS.
Keywords :
CMOS digital integrated circuits; MOSFET; UHF integrated circuits; digital phase locked loops; microwave integrated circuits; DCO; FTR; FinFET CMOS; FoM; PN; SSC; advanced semiconductor processes; all-digital phase-locked loops; figure of merit; frequency 0.25 GHz to 4 GHz; frequency tuning range; in-band phase noise; integrated-jitter fractional-N ADPLL; linear analog properties; ring-type digitally controlled oscillators; size 16 nm; size 28 nm; spread-spectrum clocking capability; time 1.22 ps; traditional analog design styles; CMOS integrated circuits; FinFETs; Jitter; Phase locked loops; Phase measurement; Phase noise; Tuning;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid- State Circuits Conference - (ISSCC), 2015 IEEE International
Conference_Location :
San Francisco, CA
Print_ISBN :
978-1-4799-6223-5
Type :
conf
DOI :
10.1109/ISSCC.2015.7063025
Filename :
7063025
Link To Document :
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