Title :
The initial frequency uncertainty tolerated by the Levenberg-Marquardt method applied to dynamic testing of A/D converters
Author :
Haddadi, Dj ; Dallet, D. ; Marchegay, Ph
Author_Institution :
Lab. de Microelectron., Bordeaux I Univ., Talence, France
Abstract :
This paper examines in some detail the convergence of the Levenberg-Marquardt method applied to A/D converter testing with sinusoidal stimulus. Firstly, we have determined the required initial guess accuracy in order to obtain the global convergence. Then, this result is used in order to develop a globally convergent modified Levenberg-Marquardt algorithm whatever the initial guess uncertainty. Simulation and experimental results are presented in order to show the effectiveness of this algorithm
Keywords :
Newton method; analogue-digital conversion; automatic testing; convergence of numerical methods; electronic equipment testing; measurement uncertainty; parameter estimation; waveform analysis; A/D converters; Levenberg-Marquardt method; dynamic testing; effectiveness; experimental results; globally convergent algorithm; initial frequency uncertainty; initial guess accuracy; simulation; sinusoidal stimulus; Convergence; Cost function; Frequency; Minimization methods; Newton method; Nonlinear distortion; Sampling methods; Strontium; Testing; Uncertainty;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2000. IMTC 2000. Proceedings of the 17th IEEE
Conference_Location :
Baltimore, MD
Print_ISBN :
0-7803-5890-2
DOI :
10.1109/IMTC.2000.846836
