The initial frequency uncertainty tolerated by the Levenberg-Marquardt method applied to dynamic testing of A/D converters

Author

Haddadi, Dj ; Dallet, D. ; Marchegay, Ph

Author_Institution

Lab. de Microelectron., Bordeaux I Univ., Talence, France

Volume

1

fYear

2000

fDate

2000

Firstpage

103

Abstract

This paper examines in some detail the convergence of the Levenberg-Marquardt method applied to A/D converter testing with sinusoidal stimulus. Firstly, we have determined the required initial guess accuracy in order to obtain the global convergence. Then, this result is used in order to develop a globally convergent modified Levenberg-Marquardt algorithm whatever the initial guess uncertainty. Simulation and experimental results are presented in order to show the effectiveness of this algorithm

Keywords

Newton method; analogue-digital conversion; automatic testing; convergence of numerical methods; electronic equipment testing; measurement uncertainty; parameter estimation; waveform analysis; A/D converters; Levenberg-Marquardt method; dynamic testing; effectiveness; experimental results; globally convergent algorithm; initial frequency uncertainty; initial guess accuracy; simulation; sinusoidal stimulus; Convergence; Cost function; Frequency; Minimization methods; Newton method; Nonlinear distortion; Sampling methods; Strontium; Testing; Uncertainty;

fLanguage

English

Publisher

ieee

Conference_Titel

Instrumentation and Measurement Technology Conference, 2000. IMTC 2000. Proceedings of the 17th IEEE

Conference_Location

Baltimore, MD

ISSN

1091-5281

Print_ISBN

0-7803-5890-2

Type

conf

DOI

10.1109/IMTC.2000.846836

Filename

846836