Title :
ADC sinewave histogram testing with quasi-coherent sampling
Author :
Carbone, Paolo ; Chiorboli, Giovanni
Author_Institution :
Dipt. di Ingegneria Elettronica e dell´´Inf., Perugia Univ., Italy
Abstract :
In this paper the accuracy of sinewave histogram testing is analyzed under the assumption of quasi-coherent sampling. It is proved that same worst-case results are obtained as already published ones, by allowing a bound on the accuracy in setting the ratio between sinewave and sampling frequencies, which is looser than that currently employed. Detailed proofs and simulation results are presented
Keywords :
analogue-digital conversion; automatic testing; parameter estimation; sampling methods; waveform analysis; ADC sinewave histogram testing; accuracy; quasi-coherent sampling; sampling frequencies; simulation; sinewave and sampling frequencies; worst-case; Analog-digital conversion; Frequency estimation; Frequency synthesizers; Histograms; Length measurement; Phase estimation; Sampling methods; State estimation; Testing; Time measurement;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2000. IMTC 2000. Proceedings of the 17th IEEE
Conference_Location :
Baltimore, MD
Print_ISBN :
0-7803-5890-2
DOI :
10.1109/IMTC.2000.846837
