DocumentCode
2064041
Title
Statistical simulation methods for circuit performance analysis
Author
Sato, Takao
Author_Institution
Sch. of Inf., Kyoto Univ., Kyoto, Japan
fYear
2013
fDate
28-31 Oct. 2013
Firstpage
1
Lastpage
4
Abstract
In this paper, statistical simulation methods that can efficiently and accurately handle device variability are reviewed with special emphasis on the acceleration of Monte Carlo simulation methods for yield analyses. The effectiveness of a sequential Monte Carlo simulation technique will be demonstrated through a yield analysis of an SRAM cell.
Keywords
Monte Carlo methods; SRAM chips; circuit simulation; integrated circuit modelling; integrated circuit yield; Monte Carlo simulation method; SRAM cell; circuit performance analysis; statistical simulation method; yield analysis; Educational institutions;
fLanguage
English
Publisher
ieee
Conference_Titel
ASIC (ASICON), 2013 IEEE 10th International Conference on
Conference_Location
Shenzhen
ISSN
2162-7541
Print_ISBN
978-1-4673-6415-7
Type
conf
DOI
10.1109/ASICON.2013.6811844
Filename
6811844
Link To Document