Some thoughts on sine wave ADC testing

Author

Sugawara, Hidetake ; Kobayashi, Haruo ; Arpaia, Pasquale

Author_Institution

Dept. of Electron. Eng., Gunma Univ., Japan

Volume

1

fYear

2000

fDate

2000

Firstpage

125

Abstract

This paper proposes state-transition plane and error plane methods to identify the ADC error type (such as additive noise, multiplicative noise, jitter and harmonics) in the sine wave ADC testing, and the theoretical analysis and simulation results demonstrate their effectiveness. Also an ADC output waveform reconstruction algorithm which is applicable for an incoherent sampling ADC testing is proposed. These results would be useful for developing new error correction algorithms and analyzing the sine wave ADC testing theoretically as well as identifying ADC error sources

Keywords

analogue-digital conversion; circuit noise; circuit testing; error correction; error detection; harmonics; jitter; ADC error sources; ADC error type identification; additive noise; error correction algorithms; error plane method; harmonics; incoherent sampling ADC testing; jitter; multiplicative noise; output waveform reconstruction algorithm; sine wave ADC testing; state-transition plane method; Additive noise; Analytical models; Degradation; Electronic equipment testing; Error correction; Frequency; Harmonic analysis; Integrated circuit noise; Jitter; Sampling methods;

fLanguage

English

Publisher

ieee

Conference_Titel

Instrumentation and Measurement Technology Conference, 2000. IMTC 2000. Proceedings of the 17th IEEE

Conference_Location

Baltimore, MD

ISSN

1091-5281

Print_ISBN

0-7803-5890-2

Type

conf

DOI

10.1109/IMTC.2000.846840

Filename

846840