Title :
Thermal expansion coefficients anisotropy of monoclinic potassium (rare-earth) double tungstates KRe(WO4)2 (Re=Gd,Y,Lu,Yb)
Author :
Loiko, P.A. ; Yumashev, K.V. ; Kuleshov, N.V. ; Rachkovskaya, G.E. ; Pavlyuk, A.A.
Author_Institution :
Center for Opt. Mater. & Technol., Belarusian Nat. Tech. Univ., Minsk, Belarus
Abstract :
Potassium-(rare-earth)-double tungstates doped with rare-earth ions [R:KRe(WO4)2, shortly KReW, Re = Gd, Lu,Y are "passive" ions while R = Nd,Yb,Tm,Ho etc. are active trivalent rare-earth ions] are the promising materials for bulk and waveguide efficient, robust and short-pulse solid-state lasers. For the aims of heat management of such laser systems, one should know the values of linear thermal expansion coefficients aT along the optical indicatrix axes Np, Nm and Ng (as the real laser elements are usually oriented along these directions). Unfortunately, up to now such measurements has not been performed (in the previous papers the values of αT obtained by X-ray analysis were reported only for crystallographic directions. The results of several dilatometric measurements is presented. The aim of present paper is the comparative experimental study of the αT anisotropy in the isostructural KReW crystals (including measurements in the Np, Nm and Ng directions).
Keywords :
X-ray analysis; gadolinium compounds; holmium; lutetium compounds; neodymium; optical waveguides; potassium compounds; solid lasers; thermal expansion; thulium; ytterbium compounds; yttrium compounds; KGd(WO4)2:Ho; KGd(WO4)2:Nd; KGd(WO4)2:Tm; KGd(WO4)2:Yb; KLu(WO4)2:Ho; KLu(WO4)2:Nd; KLu(WO4)2:Tm; KLu(WO4)2:Yb; KY(WO4)2:Ho; KY(WO4)2:Nd; KY(WO4)2:Tm; KY(WO4)2:Yb; X-ray analysis; crystallographic directions; dilatometric measurements; heat management; monoclinic potassium double tungstates; optical indicatrix axes; short-pulse solid-state lasers; thermal expansion coefficients anisotropy; waveguide efficient;
Conference_Titel :
Lasers and Electro-Optics Europe (CLEO EUROPE/EQEC), 2011 Conference on and 12th European Quantum Electronics Conference
Conference_Location :
Munich
Print_ISBN :
978-1-4577-0533-5
Electronic_ISBN :
Pending
DOI :
10.1109/CLEOE.2011.5942838