• DocumentCode
    2064173
  • Title

    Transient Saturation Spectroscopy for measuring the lifetime of hyperfine sublevels in 167Er3+ ions doped in a silicate glass fiber

  • Author

    Hashimoto, Daisuke ; Shimizu, Kaoru

  • Author_Institution
    NTT Basic Res. Labs., NTT Corp., Atsugi, Japan
  • fYear
    2011
  • fDate
    22-26 May 2011
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    We report our observation of the high population relaxation rate β of hyperfine sublevels in 167Er3+ ions doped in a silicate glass fiber (EDF). In contrast to the case with a crystalline Y2SiO5 host, we observed that the β value became two orders higher at 4 K. Furthermore, we observed the decrease in the β value with respect to the increase in the temperature from 4 K to 20 K.
  • Keywords
    erbium; glass fibres; hyperfine structure; ions; semiconductor doped glasses; semiconductor doping; Er; high population relaxation rate; hyperfine sublevels; ions; silicate glass fiber; transient saturation spectroscopy; Optical polarization; Transient analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics Europe (CLEO EUROPE/EQEC), 2011 Conference on and 12th European Quantum Electronics Conference
  • Conference_Location
    Munich
  • ISSN
    Pending
  • Print_ISBN
    978-1-4577-0533-5
  • Electronic_ISBN
    Pending
  • Type

    conf

  • DOI
    10.1109/CLEOE.2011.5942839
  • Filename
    5942839
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2064173