Title :
Superconducting Fault Current Limiters - a new device for future smart grids
Author :
Bock, J. ; Hobl, A. ; Schramm, J.
Abstract :
Nexans SuperConductors (NSC) has designed, built, tested, and installed a number of SFCL (Superconducting Fault Current Limiter) systems. The devices are in different areas and cases of operation with various requirements and specifications from DSOs or power generation industry. Prospective short-circuit currents in the order of 50 kA have been limited to below 10 kA according to the design of the limiter. The limiters have shown reliable operation during field tests with durations of about one year each. The operation results and experiences will be presented. In a recent EU-project developing a multi-purpose SFCL providing flexibility for a range of power grid applications is targeted. Nexans acts as a coordinator and device manufacturer in the ECCOFLOW consortium which involves five European power utilities and eight scientific and industrial partners. In another recent project, a superconductor power transmission system by Nexans is to be integrated 2013 in the inner city of Essen, Germany. It comprises a 1-km long 10 kV three-phase concentric HTS cable overload-protected by a SFCL. The SFCL device will also be manufactured by Nexans SuperConductors. The status of both projects will also be reported on.
Keywords :
high-temperature superconductors; power generation protection; power transmission protection; short-circuit currents; smart power grids; superconducting cables; superconducting fault current limiters; DSO; ECCOFLOW consortium; European power utility; HTS cable overload protection; Nexans superconductor; SFCL; current 10 kA; current 50 kA; field test; future smart power grid; power generation industry; short-circuit current; superconducting fault current limiter; superconductor power transmission system; Growing electricity demand; distributed generation; short circuit power increase; superconducting fault current limiter;
Conference_Titel :
Electricity Distribution (CICED), 2012 China International Conference on
Conference_Location :
Shanghai
Print_ISBN :
978-1-4673-6065-4
Electronic_ISBN :
2161-7481
DOI :
10.1109/CICED.2012.6508729