DocumentCode :
2064701
Title :
A 10-bit pipelined ADC with improved S/H circuit for CMOS image sensor
Author :
Yiling Ding ; Qi Zhang ; Ning Wang ; Dunshan Yuan ; Guohong Li ; Hui Wang ; Songlin Feng
Author_Institution :
Shanghai Adv. Res. Inst., Shanghai, China
fYear :
2013
fDate :
28-31 Oct. 2013
Firstpage :
1
Lastpage :
4
Abstract :
A 10-bit pipelined ADC with an improved S/H circuit for CMOS image sensor is presented in this paper. The improved S/H circuit is proposed to adjust the range of the input signal, eliminate dark current noise and calibrate offset voltage. The dark current noise and offset voltage can be calibrated with a DAC feedback loop and two feedback capacitances. During the sample phase, a special modulation voltage is generated to widen the range of input signal. The simulation results show that the maximum error voltage to be calibrated is up to 0.5V. The ADC achieves a SNDR of 58.4dB and ENOB of 9.4bits at 30MHz sample rate. The DNL and INL are 0.27LSB and 0.48LSB respectively.
Keywords :
CMOS image sensors; analogue-digital conversion; detector circuits; pipeline processing; CMOS image sensor; S/H circuit; analog-digital converter; dark current noise elimination; modulation voltage; pipelined ADC; CMOS image sensors; Calibration; Dark current; Electronics packaging; Lighting; Noise;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
ASIC (ASICON), 2013 IEEE 10th International Conference on
Conference_Location :
Shenzhen
ISSN :
2162-7541
Print_ISBN :
978-1-4673-6415-7
Type :
conf
DOI :
10.1109/ASICON.2013.6811872
Filename :
6811872
Link To Document :
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