• DocumentCode
    2064756
  • Title

    Direct Extraction of All Four Transistor Noise Parameters from a Single Noise Figure Measurement

  • Author

    Tasker, P.J. ; Reinert, W. ; Braunstein, J. ; Schlechtweg, M.

  • Volume
    1
  • fYear
    1992
  • fDate
    5-9 Sept. 1992
  • Firstpage
    157
  • Lastpage
    162
  • Abstract
    A measurement and analysis technique has been developed that allows for, after s-parameter measurements, direct extraction of all four transistor noise parameters from a single noise figure measurement. A simple 50 ¿ noise source measurement system can thus be used for noise parameter extraction, simplifying considerably the measurement of noise parameters and so enablitg fully automated high frequency testing and wafer mappintg measurement systems to provide both s-parameters and noise parameters.
  • Keywords
    Circuit noise; Costs; Design optimization; Frequency measurement; Impedance measurement; Noise figure; Noise measurement; Satellite broadcasting; Scattering parameters; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference, 1992. 22nd European
  • Conference_Location
    Helsinki, Finland
  • Type

    conf

  • DOI
    10.1109/EUMA.1992.335733
  • Filename
    4135444
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2064756