• DocumentCode
    2064923
  • Title

    Inverse circuit simulation based low-frequency noise extraction in SiGe HBTs

  • Author

    Niu, Guofu ; Tang, Jin ; Feng, Zhiming ; Sheridan, David ; Harame, David L.

  • Author_Institution
    Alabama Microelectronics Science and Technology Center
  • fYear
    2004
  • fDate
    13-14 Sept. 2004
  • Firstpage
    221
  • Lastpage
    224
  • Keywords
    Circuit noise; Circuit simulation; Equivalent circuits; Germanium silicon alloys; Heterojunction bipolar transistors; Low-frequency noise; Noise measurement; Signal to noise ratio; Silicon germanium; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Bipolar/BiCMOS Circuits and Technology, 2004. Proceedings of the 2004 Meeting
  • Print_ISBN
    0-7803-8618-3
  • Type

    conf

  • DOI
    10.1109/BIPOL.2004.1365785
  • Filename
    1365785
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2064923