Title :
Design of a new RF BIST circuit for 5.25GHz low noise amplifiers
Author :
Ryu, Jee-Youl ; Kadam, Dharma ; Alex, Tinku ; Kim, Bruce C.
Author_Institution :
Arizona State University
Keywords :
Built-in self-test; Circuit noise; Circuit testing; Gain measurement; Impedance measurement; Low-noise amplifiers; Noise figure; Radio frequency; Radiofrequency amplifiers; Voltage;
Conference_Titel :
Bipolar/BiCMOS Circuits and Technology, 2004. Proceedings of the 2004 Meeting
Print_ISBN :
0-7803-8618-3
DOI :
10.1109/BIPOL.2004.1365794