• DocumentCode
    2065149
  • Title

    The key to concurrent engineering is design tools

  • Author

    Simpson, William R.

  • Author_Institution
    Inst. for Defense Anal., Alexandria, VA, USA
  • fYear
    1996
  • fDate
    20-25 Oct 1996
  • Firstpage
    937
  • Abstract
    The dream of concurrent engineering has been largely unfulfilled. We have made strides in a limited subset of concurrent practices, such as design and manufacturing, but have not been able to fully integrate all aspects of a products life cycle. We still essentially engineer the support package as an after-the-fact product and designers and manufacturers worry primarily about time-to-market. Yet it is clear that given some level of test capability requirement there are ways to reduce the cost of providing that test capability in the overall life-cycle. Test capability includes manufacture, product assurance and field service. Design for testability is a passive set of design rules applied to a design. A more robust approach would be a pro-active analysis of testability factors. Yet our tools are not capable of linking this pro-active approach to CAD representations. Recreating information is an expensive luxury we can no longer afford, yet standard formats for data representations are too numerous to use properly. Further, our CAD tools do not provide the slots and facets for data that can be developed over the product life cycle and introduced as value-added to the design representation
  • Keywords
    concurrent engineering; design for testability; production testing; quality control; CAD representations; concurrent engineering; design for testability; design representation; design tools; field service; overall life-cycle; pro-active analysis; product assurance; product life cycle; test capability requirement; testability factors; Concurrent engineering; Costs; Design automation; Design engineering; Design for testability; Life testing; Manufacturing; Packaging; Product design; Time to market;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1996. Proceedings., International
  • Conference_Location
    Washington, DC
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-3541-4
  • Type

    conf

  • DOI
    10.1109/TEST.1996.557166
  • Filename
    557166