DocumentCode :
2065241
Title :
Experimental verification of substrate coupling in a high-gain 30 Gb/s SiGe amplifier
Author :
Steiner, W. ; Rein, H.M. ; Berntgen, J.
Author_Institution :
Ruhr-University Bochum, AG
fYear :
2004
fDate :
13-14 Sept. 2004
Firstpage :
273
Lastpage :
276
Keywords :
Bonding; Circuit optimization; Circuit testing; Coupling circuits; Germanium silicon alloys; Isolation technology; Optical amplifiers; Optical receivers; Semiconductor device measurement; Silicon germanium;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Bipolar/BiCMOS Circuits and Technology, 2004. Proceedings of the 2004 Meeting
Print_ISBN :
0-7803-8618-3
Type :
conf
DOI :
10.1109/BIPOL.2004.1365798
Filename :
1365798
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2065241
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