Title :
ESD protection of the high voltage tolerant pins in low-voltage BiCMOS processes
Author :
Vashchenko, V.A. ; Beek, M. Ter ; Kindt, W. ; Hopper, P.
Author_Institution :
National Semiconductor Corporation
Keywords :
BiCMOS integrated circuits; Breakdown voltage; CMOS process; Diodes; Electrostatic discharge; Low voltage; Pins; Protection; Resistors; Thyristors;
Conference_Titel :
Bipolar/BiCMOS Circuits and Technology, 2004. Proceedings of the 2004 Meeting
Print_ISBN :
0-7803-8618-3
DOI :
10.1109/BIPOL.2004.1365799
