DocumentCode

2065264

Title

ESD protection of the high voltage tolerant pins in low-voltage BiCMOS processes

Author

Vashchenko, V.A. ; Beek, M. Ter ; Kindt, W. ; Hopper, P.

Author_Institution

National Semiconductor Corporation

fYear

2004

fDate

13-14 Sept. 2004

Firstpage

277

Lastpage

280

Keywords

BiCMOS integrated circuits; Breakdown voltage; CMOS process; Diodes; Electrostatic discharge; Low voltage; Pins; Protection; Resistors; Thyristors;

fLanguage

English

Publisher

ieee

Conference_Titel

Bipolar/BiCMOS Circuits and Technology, 2004. Proceedings of the 2004 Meeting

Print_ISBN

0-7803-8618-3

Type

conf

DOI

10.1109/BIPOL.2004.1365799

Filename

1365799