Waveform characterization of few-cycle laser pulses in real-time using above-threshold ionization

The authors have recently proposed and implemented a technique, which utilizes a stereographic measurement of the above-threshold ionization (ATI) of Xe and fast electronics, to determine the carrier-envelope phase CEP of every pulse in a kHz pulse train individually and in real-time with a precision of 6.5°. The stereo-ATI technique is ideal for data tagging and allows one to determine the CEP dependence of a process without the need for CEP locking. The advantages and robust nature of this technique have been illustrated in a measurement of the CEP dependence of non-sequential double ionization (NSDI) in Ar using stereo-ATI CEP tagging in conjunction with a cold-target recoil-ion momentum spectroscopy (COLTRIMS).