DocumentCode :
2065429
Title :
The current mirror thermal characterization method and its implementation in a power SOI BJT process
Author :
Kim, Jonggook ; Liu, Yun ; De Santis, Joseph A. ; Brisbin, Douglas
Author_Institution :
Advanced Process Technology Development
fYear :
2004
fDate :
13-14 Sept. 2004
Firstpage :
305
Lastpage :
309
Keywords :
Area measurement; Current density; Current measurement; Mirrors; Semiconductor optical amplifiers; Silicon on insulator technology; Temperature; Thermal resistance; Transistors; Voltage control;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Bipolar/BiCMOS Circuits and Technology, 2004. Proceedings of the 2004 Meeting
Print_ISBN :
0-7803-8618-3
Type :
conf
DOI :
10.1109/BIPOL.2004.1365806
Filename :
1365806
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2065429
بازگشت