• DocumentCode
    2065489
  • Title

    A process variation insensitive bandgap reference with self-calibration technique

  • Author

    Ling Du ; Ning Ning ; Kejun Wu ; Yang Liu ; Qi Yu

  • Author_Institution
    State Key Lab. of Electron. Thin Films & Integrated Devices, Univ. of Electron. Sci. & Technol. of China, Chengdu, China
  • fYear
    2013
  • fDate
    28-31 Oct. 2013
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    A process variation insensitive bandgap reference with self-calibration is presented. The initial accuracy of the bandgap reference is improved with self-calibration. The offset voltage caused by components mismatch due to process variation is averaged with a 6-bit resistor trimming array and the code for trimming is generated by the circuit itself. The 3σ inaccuracy of the bandgap reference decreases from ±12.6% to ±1.0% with the self-calibration. The circuit consumes 43.5μW and occupies 0.025mm2 in a standard 65nm 1P6M CMOS technology.
  • Keywords
    CMOS integrated circuits; calibration; resistors; 1P6M CMOS; bandgap reference; components mismatch; power 43.5 muW; resistor; self-calibration technique; size 65 nm; word length 6 bit; Arrays; Calibration; Photonic band gap; Resistance; Resistors; Temperature measurement; Voltage measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ASIC (ASICON), 2013 IEEE 10th International Conference on
  • Conference_Location
    Shenzhen
  • ISSN
    2162-7541
  • Print_ISBN
    978-1-4673-6415-7
  • Type

    conf

  • DOI
    10.1109/ASICON.2013.6811901
  • Filename
    6811901