Title :
A process variation insensitive bandgap reference with self-calibration technique
Author :
Ling Du ; Ning Ning ; Kejun Wu ; Yang Liu ; Qi Yu
Author_Institution :
State Key Lab. of Electron. Thin Films & Integrated Devices, Univ. of Electron. Sci. & Technol. of China, Chengdu, China
Abstract :
A process variation insensitive bandgap reference with self-calibration is presented. The initial accuracy of the bandgap reference is improved with self-calibration. The offset voltage caused by components mismatch due to process variation is averaged with a 6-bit resistor trimming array and the code for trimming is generated by the circuit itself. The 3σ inaccuracy of the bandgap reference decreases from ±12.6% to ±1.0% with the self-calibration. The circuit consumes 43.5μW and occupies 0.025mm2 in a standard 65nm 1P6M CMOS technology.
Keywords :
CMOS integrated circuits; calibration; resistors; 1P6M CMOS; bandgap reference; components mismatch; power 43.5 muW; resistor; self-calibration technique; size 65 nm; word length 6 bit; Arrays; Calibration; Photonic band gap; Resistance; Resistors; Temperature measurement; Voltage measurement;
Conference_Titel :
ASIC (ASICON), 2013 IEEE 10th International Conference on
Conference_Location :
Shenzhen
Print_ISBN :
978-1-4673-6415-7
DOI :
10.1109/ASICON.2013.6811901