DocumentCode
2065744
Title
Asynchronous design: working the fast lane
Author
Roncken, Marly
Author_Institution
Philips Res. Labs., Eindhoven, Netherlands
fYear
1996
fDate
20-25 Oct 1996
Firstpage
939
Abstract
We are on the verge of a breakthrough into Philips Product Divisions and now the spot-light is on testing. So far, we have fabricated, tested, and characterized about ten asynchronous IC designs. Recently, we developed a test method which is competitive with modern synchronous test methods in quality and test time. Tangram is poised for CAT success
Keywords
asynchronous circuits; automatic testing; design for testability; integrated circuit design; logic CAD; logic testing; CAT; IC designs; Philips Product Divisions; Tangram; asynchronous design; logic testing; test method; test time; Asynchronous circuits; Batteries; Cellular phones; Circuit testing; Costs; Feedback; Integrated circuit testing; Laboratories; Timing; Wireless communication;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1996. Proceedings., International
Conference_Location
Washington, DC
ISSN
1089-3539
Print_ISBN
0-7803-3541-4
Type
conf
DOI
10.1109/TEST.1996.557168
Filename
557168
Link To Document